MatNet Facilities
1. Ion Beam Accelerator
Case Western Reserve University
This system consists of a 1.7 MV tandem pelletron accelerator for the production of
3.4 MeV protons, 5.1 MeV alpha particles, and N ions with energies in excess of
7.0 MeV. Can provide thin film depth profile analysis using Rutherford Back Scatter-
ing (RBS); hydrogen and stable isotopic depth profile analysis using Nuclear Reaction
Analysis (NRA); and chemical analysis using Proton-induced X-ray Emission (PIXE).
In most instances the analysis is non-destructive.
NEC 5SDH.
Contact: Dr. Arthur H. Heuer
(216) 368-3868
e-mail: ahh@po.cwru.edu
2. High Resolution Field Emission Scanning Electron Microscope
Case Western Reserve University
This instrument has two secondary electron detectors, a back scatter detector, and
an infrared chamber scope. In addition, it has a Noran energy dispersive x-ray detec-
tion system and an EBSP detector capable of producing Kikuchi patterns suitable for
crystallographic analysis. The microscope is capable of operating at a spatial reso-
lution of less than 1.5nm at an energy of 15kV.
Hitachi S-4500 FE SEM.
Contact: Dr. Arthur H. Heuer
(216) 368-3868
e-mail: ahh@po.cwru.edu
3. Scanning Transmission Electron Microscope
Case Western Reserve University
This 200kV STEM is equipped with a Noran x-ray detector (HPGe UTW) sensitive to a
broad range of energies and is capable of detecting light elements including boron,
as well as heavier elements. The system also has a Gatan PEELS (Parallel-acquisition
Electron Energy Loss Spectrometer) for light element detection and analysis. This
configuration enables microchemical and microcrystallographic analysis at spatial
resolution down to about 10 nm.
Philips CM20.
Contact: Dr. Arthur H. Heuer
(216) 368-3868
e-mail: ahh@po.cwru.edu
4. High Resolution Transmission Electron Microscope
Case Western Reserve University
Working at an accelerating voltage of 400kV, this high resolution microscope operates
with a point to point resolution of better than 0.19 nm.
JEOL 4000 EX
Contact: Dr. Arthur H. Heuer
(216) 368-3868
e-mail: ahh@po.cwru.edu
5. Scanning Auger Microprobe & Secondary Ion Mass Spectrometer
Case Western Reserve University
This system is composed of a conventional scanning electron microscope with a lan-
thanum hexaboride (LaB6)cathode, a secondary electron detector, and an axial cylind-
rical mirror analyzer to detect Auger electrons produced during electron imaging.
Very small spot sizes are available down to 20nm for imaging, and several hundred nm
for rapid Auger data acquisition using high beam currents. Inert gas sputtering is
used to clean the surface. In situ fracture stage for inducing intergranular frac-
ture to study grain boundary segregation. The Secondary Ion Mass Spectrometer is
capable of a mass range up to 512 amu, and is particularly useful for isotopic
studies of surface chemistry and trace element analysis.
PHI 660 Auger
PHI 3600 SIMS
PHI 04-303.
Contact: Dr. Gary M. Michal
(216) 368-5070
e-mail: gmm3@po.cwru.edu
6. Electron Spectroscopy for Chemical Analysis (XPS)
Case Western Reserve University
System includes a conventional dual anode x-ray source (Mg & Al), a 20Ó hemispheri-
cal electron energy analyzer, a XYZT sample stage with 8 sample storage, and an
inert gas sputtering source (PHI 04-303.) Includes a monochromated aluminum anode
x-ray source, a multi-channel detector, a sample stage cooling attachment, and a
small spot (30 µm) electron lens with sample imaging and mapping capability.
PHI5600 ESCA.
Contact: Dr. Gary M. Michal
(216) 368-5070
e-mail: gmm3@po.cwru.edu
7. X-ray Diffractometer with High Temperature Capabilities
Case Western Reserve University
4kW ultrastable x-ray diffraction system, including q/q wide angle goniometer with
independently controlled stepper motors. Can also be used in q/2q mode. Acces-
sories include high temperature (2000¼C) vacuum furnace, thin film grazing angle
collimation attachment, third axis stress measurement attachment and Peltier-
cooled detector for high count rate.
Scintag 6-S-4R XRD System
Contact: Dr. Gary M. Michal
(216) 368-5070
e-mail: gmm3@po.cwru.edu
8. Mechanical Testing Facility
Case Western Reserve University
This facility enables testing under static, dynamic, and cyclic conditions, over
temperatures ranging from -196 C to 1400 C. High alignment grips and hydraulic
grips are available for testing brittle and semi-brittle materials, while crack
growth can be measured via optical, compliance, or D.C. potential drop techniques.
Creep testing frames are available, as is a novel high gas, high temperature pres-
sure testing device which enables tension testing with superposed hydrostatic
pressures of up to 100 kpsi at temperatures up to 1200 C. A unique 550,000 lb.
capacity Manufacturing Process Simulator, which will enable sheet metal forming
experiments and forging simulations, is currently under construction.
Screw Driven Test Frames
2 Instron 1100
1 Instron 1361 (Electro-Mechanical)
Servo Hydraulic Test Frames
1 MTS (50,000 lbs., w/±3 in travel)
1 MTS (20,000 lbs., w/±3 in travel)
1 MTS (3,000 lbs., w/±2 in travel)
Impact Machine
1 Wiedeman Baldwin with Dynatop Instrumentation
Contact: Dr. John Lewandowski
(216) 368-4234
e-mail: jjl3@po.cwru.edu
9. Molecular Beam Epitaxy Facility
University of Cincinnati
The facility provides investigators with state-of-the-art capabilities to fabricate
semiconductor thin films with closely controlled properties.
Contact: Dr. Andrew Steckl
(513) 556-4777
e-mail: asteckl@uceng.uc.edu
10. Analytical Transmission Electron Microscope
The Ohio State University
This electron microscope offers a resolution down to 0.18 nm and can be operated
up to 300kV accelerating voltage. There are single tilt, double tilt, and heating
sample holders.
Hitachi H-9000 NAR
Contact: Dr.Hendrik Colijn Dr.Cameron Begg
(614) 292-0674 or (614) 292-4429
e-mail: colijn.1@osu.edu begg.4@osu.edu
11. Analytical Transmission Electron Microscope
The Ohio State University
This 200kV instrument with LaB6 electron source is optimized for crystallographic
work. It has fine probe and CBED capabilities and offers a resolution down to
0.27 nm. A light element x-ray detector and serial electron energy-loss spectro-
meter are attached.
Philips CM-200 TEM
Contact: Dr.Hendrik Colijn Dr.Cameron Begg
(614) 292-0674 or (614) 292-4429
e-mail: colijn.1@osu.edu begg.4@osu.edu
12. Analytical Transmission Electron Microscope
The Ohio State University
This 200kV instrument has a field emission electron gun (FEG) for high source
brightness. This allows very high electron currents in small probes. Attach-
ments include a light-element x-ray detector and Gatan imaging filter electron
energy-loss spectrometer for PEELS and energy filtered imaging. The microscope
has fine probe and CBED capabilities and offers down to a 0.24 nm resolution.
Philips CM-200FEG TEM
Contact: Dr.Hendrik Colijn Dr.Cameron Begg
(614) 292-0674 or (614) 292-4429
e-mail: colijn.1@osu.edu begg.4@osu.edu
13. Teaching Transmission Electron Microscope
The Ohio State University
This instrument operates up to a 200kV accelerating voltage and utilizes a Be win-
dow EDS detector.
Philips EM-400T
Contact: Dr.Hendrik Colijn Dr.Cameron Begg
(614) 292-0674 or (614) 292-4429
e-mail: colijn.1@osu.edu begg.4@osu.edu
14. Scanning Electron Microscope
The Ohio State University
This instrument has a field emission gun for high brightness for both low voltage
and high resolution imaging down to 1.5 nm. Operates at a 200V-30kV accelerating
voltage and has a light element x-ray detector, along with SE, SC, BSE, EBSP, and
EBIC detectors
Philips XL-30
Contact: Dr.Hendrik Colijn Dr.Cameron Begg
(614) 292-0674 or (614) 292-4429
e-mail: colijn.1@osu.edu begg.4@osu.edu
15. Scanning Electron Microscope
The Ohio State University
This general purpose SEM operates at 10-25kV accelerating voltage with W source
and has a resolution of 6.0 nm. It has secondary electron and back scattered elec-
tron detectors with digital imaging and mapping using a Be window EDS system.
Hitachi S-510
Contact: Dr.Hendrik Colijn Dr.Cameron Begg
(614) 292-0674 or (614) 292-4429
e-mail: colijn.1@osu.edu begg.4@osu.edu
16. X-Ray Diffractometer
The Ohio State University
This instrument has a Cu anode, 2kW sealed tube x-ray source and a 3 circle gonio-
meter with pole-figure attachment with integrated computer control.
Scintag PAD-V
Contact: Dr.Hendrik Colijn Dr.Cameron Begg
(614) 292-0674 or (614) 292-4429
e-mail: colijn.1@osu.edu begg.4@osu.edu
17. Hot Stage X-Ray Diffractometer
The Ohio State University
This instrument has a Cu anode, 2kW sealed tube x-ray source with a q-q gonio-
meter and offers controlled atmosphere heating to 1400¡C with integrated computer
control.
Scintag XDS-2000
Contact: Dr.Hendrik Colijn Dr.Cameron Begg
(614) 292-0674 or (614) 292-4429
e-mail: colijn.1@osu.edu begg.4@osu.edu
18. X-Ray Camera System
The Ohio State University
This system utilizes a Cu Anode, 2kW sealed tube x-ray source and provides Laue,
Debye-Scherrer, and other cameras.
Philips XRG-3000
Contact: Dr.Hendrik Colijn Dr.Cameron Begg
(614) 292-0674 or (614) 292-4429
e-mail: colijn.1@osu.edu begg.4@osu.edu
19. Surface Analysis Laboratory
The Ohio State University
Laboratory contains: -Vacuum generator dual chamber -ESCA (XPS) chamber -Al mono-
chromatic x-ray, Al/Mg twin x-ray -Auger (AES) focus electron gun -UPS/HeI& HeII
UV source - hemispherical analyser. SIMS chamber -duoplasmatron -MIG metal ion
gun -SIMS & RGA detector. Prep Chamber: AG21 sputter gun, fracture attachment,
vacuum transport vessel. Vacuum leak detector.
Contact: Joel Haynes
(614) 292-2760
e-mail: jahaynes@mps.ohio-state.edu
20. High Frequency Conductivity Facility
The Ohio State University
This high frequency dielectric response lab allows measurement of high frequency,
75-100 GHz (W band), microwave complex dielectric response. Measurement ability
ranges from insulating materials (e ~ 1 - 10 , s < 10-6 S/cm) to highly conduc-
ting materials (e ~ 103, s ~ 102 S/cm).
Wiltron 360B Vector Network Analyzer
WR 10-2 Waveguide fixture
Contact: Dr. Wonpil Lee
(614) 292-6859
e-mail: wplee@mps.ohio-state.edu
21. Time-Resolved Optical Response Facility
The Ohio State University
The facility consists of a 100 femtosecond Titanium -Sapphire kilohertz laser
system. This system provides femtosecond resolution and timescales from femto-
seconds to nanoseconds.
Spectra Physics 2080 Argon Ion Laser
Spectra Physics Tsunami Ti:S Laser
Positive Light Spitfire kilohertz amplifier
Photometrics CCD camera and Chromex spectrographs
Contact: Dr. Linn Van Woerkom
(614) 292-9626
e-mail: lvw@mps.ohio-state.edu
22. Mechanical Behavior Laboratory
The Ohio State University
This facility provides for the mechanical testing of materials and components.
Equipment available includes: Screw-driven Test Frames, Servo-Hydraulic Test
Frames, and Hydraulic Forming Simulator.
Screw-Driven Test Frames
Instron 1362 (22,000 pounds capacity w/± 2 in travel)
Monsanto Benchtop (5,000 pounds tension only w/8 in travel)
Servo-Hydraulic Test Frames
Instron 1331 ( 22,000 pounds capacity w/±2 in travel)
Instron 1322 (55,000 pounds capacity w/±5 in travel and furnaces for temperatures up to 1500¼C)
MTS (110,000 pounds capacity w/±3in travel)
Contact: Dr. Lloyd Barnhart
(614) 292-5456
e-mail: Barnhart.44@osu.edu
23. Plasma Transferred-Arc Materials Processing System
The Ohio State University
This system allows the preparation of reliable, pure and reproducible samples of
metallic, intermetallic, alloy, some ceramic, and composite, materials for aero-
space and automotive structural materials. Samples produced on a prototype indus-
trial scale. Under construction.
Contact: Dr. Hamish Fraser
(614) 292-2708
e-mail: fraser@kcgl1.eng.ohio-state.edu
or
Dr. Mike Mills
(614) 292-7514
e-mail: millsmj@kcgl1.eng.ohio-state.edu
or
Dr. Carroll Mobley
(614) 292-5770
e-mail: mobley.1@osu.edu
24. Solid-State Nuclear Magnetic Resonance (NMR) Spectroscopy Facility
The Ohio State University
This facility will be used for the study of structural and electronic properties of
ceramics, glasses, catalysts, high temperature superconductors, and organic/inor-
ganic polymers. Facility will house a 9.4 Tesla (400MHz-1H) spectrometer with a
double resonance variable temperature high speed magic-angle spinning probe and a
double resonance variable temperature static sample probe. Operational Spring, 1996.
Contact: Dr. Charles Cottrell or Dr. Philip Grandinetti
(614) 292-0489 (614) 292-6818
e-mail: cottrell.2@osu.edu grandinetti.1@osu.edu
25. X-Ray Materials Analysis Center
University of Akron
A state-of-the-art analysis center for the characterization of polymeric material
of all types. An innovative plate imaging system will allow very fast collection
of wide angle diffraction data using a 18kW rotating anode source. Samples may
also be probed with small angle scattering. Under construction.
Contact: Dr. Stephen Cheng or Dr. Mark Foster
(216) 972-6931 (216) 972-5323
e-mail: foster@charles.polymer.uakron.edu
26. Electron Emission Spectrometer (ESCA)
Case Western Reserve University
This instrument allows exploration of surfaces to a depth of 0.4 to 8.0 nm.
Sputtering can be used to remove surface contaminants in very thin layers
(1.5 to 2.5 nm). A high intensity x-ray source has been installed that provides
high sensitivity.
Varian VIEE-15
Contact: Dr. Gheorghe D. Mateescu
(216) 368.2589
e-mail: gdm2@po.cwru.edu
27. Ion Scattering Spectrometer (ISS)
Case Western Reserve University
This instrument can be used for the elemental analysis of the first atomic layer
with a sensitivity limit of approximately 10-3 monolayer. Very low primary ion
current densities ensure minimal damage to sample.
Ultrahigh Vacuum ISS
Contact: Dr. Gheorghe D. Mateescu
(216) 368.2589
e-mail: gdm2@po.cwru.e
28. Secondary Ion Mass Spectrometer (SIMS)
Case Western Reserve University
This instrument makes it possible to measure mass spectra of virtually any kind
of sample since there are no limits set by the specimenÕs vapor pressure.
Detection limits are as low as 10-9g. This instrument allows element mapping
in the x-y plane that can be combined with depth profiling in order to obtain
3D elemental analysis.
Contact: Dr. Gheorghe D. Mateescu
(216) 368.2589
e-mail: gdm2@po.cwru.e
29. Laser Raman Spectrometer
Case Western Reserve University
This instrument is equipped with a double-pass monochromator and a CR-8 (8W)
argon laser. Features include: a large sample compartment, variable temper-
ature capability, sample spinning, slit widths down to 1mm. and photon counting
or DC level multiplier detector.
SPEX Ramalog-5
Contact: Dr. Gheorghe D. Mateescu
(216) 368.2589
e-mail: gdm2@po.cwru.e
30. Superconductive Fourier Transform NMR
Case Western Reserve University
This system offers highly-enhanced sensitivity associated with a wide variety of
double and triple resonance capabilities. In addition to protons, deuterons,
and fluorine nuclei, the system provides access to other nuclei including
lithium-7, boron-11, carbon-12, nitrogen-15, oxygen-17, sodium-23, silicon-29,
phosphorus-31, sulfur-33 and selenium-77. System operates at 4.7 Tesla (200 MHz).
Varian XL-200M
Contact: Dr. Gheorghe D. Mateescu
(216) 368.2589
e-mail: gdm2@po.cwru.e
31. Superconductive Fourier Transform NMR (FTNMR)
Case Western Reserve University
This system offers highly-enhanced sensitivity associated with a wide variety
of double and triple resonance capabilities. The system is used primarily for
routine proton measurements. System operates at 4.7 Tesla (200 MHz).
Varian XL 200H
Contact: Dr. Gheorghe D. Mateescu
(216) 368.2589
e-mail: gdm2@po.cwru.e
32. Nuclear Magnetic Resonance (NMR) Spectroscopy
Case Western Reserve University
This 400 MHz (9.4 Tesla) system provides excellent sensitivity, dynamic range
and resolution. High resolution solid state multinuclear measurements can be
done via CP-MAS (crosspolarization-magic angle spinning). Wide line spectroscopy
can also be performed. Probes are available with inserts from 5 to 20 mm dia-
meter that will ensure multinuclear measurements from 13.9 MHz (109Ag) to
400.13 MHz(1H).
Bruker MSL-400
Contact: Dr. Gheorghe D. Mateescu
(216) 368.2589
e-mail: gdm2@po.cwru.e
33. Nuclear Magnetic Resonance (NMR) Microscopy
Case Western Reserve University
This microscope, which is installed on the MSL-400, offers extremely high reso-
lution by intrinsic sensitivity of the high field spectrometer and by the out-
standing strength of the x, y, z, field gradients which can be set at values ex-
ceeding 100 Gauss/cm.
Contact: Dr. Gheorghe D. Mateescu
(216) 368.2589
e-mail: gdm2@po.cwru.e
email: gdm2@po.cwru.edu
34. Electron Paramagnetic Resonance (EPR) Spectrometer
Case Western Reserve University
This instrument provides detection of paramagnetic centers in organic and in-
organic molecules (e.g. free radicals)in solution and solid state at various
temperatures. Resonance frequency: 8.8-9.6 GHz (X-band).
Varian E-line Century Series
Contact: Dr. Gheorghe D. Mateescu
(216) 368.2589
e-mail: gdm2@po.cwru.e
35. Cryogenic GC-FTIR
Case Western Reserve University
This instrument offers the unique capability of isolating on a gold disk at 8¼K,
in a single operation, minute chromatographic fractions into an argon matrix.
Elimination of rotational broadening combined with the possibility of accumulating
many scans, increases the sensitivity of this technique by a factor of 100. The
spectrometer can be used separately in transmission and reflectance modes such as
ATR (Attenuated Total Reflectance) and diffuse reflectance.
Mattson Sirius-100
Contact: Dr. Gheorghe D. Mateescu
(216) 368.2589
e-mail: gdm2@po.cwru.e
36. GC Mass Spectrometer
Case Western Reserve University
This instrument is a dual-sector mass spectrometer which, in addition to the
conventional EI (electron impact) source, has CI (chemical ionization) and FAB
(fast atom bombardment ) capabilities. The resolution attainable in EI and CI
modes is 7000 amu. At low resolution, FAB and GC/MS measurements can be made.
The practical mass limit in FAB is 3000 amu; it can be expanded to 7000 amu with
an added postacceleration detector.
Kratos MS25RFA
Contact: Dr. Gheorghe D. Mateescu
(216) 368.2589
e-mail: gdm2@po.cwru.e
37. Single Crystal X-ray Crystallographic System
Case Western Reserve University
This system consists of a P3 diffractometer with a low temperature setup,
Tektronix 4207, a Nicolet crystallographic work station and other equipment.
The ShellXTL programs, written by George Sheldrick are used for rapid structure
solution and presentation of graphics.
Nicolet R3 M/V
Contact: Dr. Gheorghe D. Mateescu
(216) 368.2589
e-mail: gdm2@po.cwru.e
38. Scanning Electron Microscope
Bowling Green State University
An SEM utilizing a lanthanum hexaboride source with an accelerating voltage
range of 0.2 to 30 kilovolts. Ultimate resolution is 3.5 nm. Accessories include
a backscattered electron detector and energy dispersive X-ray analysis system
with windowless capabilities (detection down to boron).
Contact: Dr. Carol Heckman
(419) 372-8218
e-mail: heckman@bgnet.bgsu.edu
39. Transmission Electron Microscope
Bowling Green State University
A conventional tungsten source TEM with attached CCD camera interfaced to a Sun
workstation to provide comprehensive image collection and analysis capability.
Contact: Dr. Carol Heckman
(419) 372-8218
e-mail: heckman@bgnet.bgsu.edu
39. Hall Measurement System
Lake Shore Cryotronics, Inc.
An advanced, fully integrated hardware/software system that characterize electronic transport
properties of materials over a wide range of temperature and magnetic field. The system measures
Hall voltage, resistance, magnetoresistance, and current-voltage characteristics, and calculate
resistivity, Hall coefficient, carrier concentration and mobility for all manner of semiconductor
materials, including Si, Ge, SiGe, GaAs, GaN, AlGaAs, InP, CdTe, HgCdTe as well as quantum wells,
heterostructures, HEMTs, etc.
Contact: Mr. Shane Hritz
(614) 891-2243 ext. 112
e-mail: